| 제목 |
반도체 수준의 FMEDA 수행 방안 |
| 분야 |
기타 |
| 언어 |
Korean |
| 저자 |
박병규(에스피아이디), 주백수(에스피아이디), 이승환(에스피아이디) |
| Key Words |
Functional safety(기능안전) ISO 26262(자동차 기능 안전성 국제 표준), Random hardware failure(하드웨어 우발 고장), Base failure rate(기본 고장률), Failure modes effects and diagnostics analysis(고장모드 영향 및 진단 분석), Quantitative safety analysis of semiconductor level(반도체 수준의 정량적 안전분석), Semiconductor(반도체) |
| 초록 |
Quantitative evaluation of random failure for semiconductor elements is essential in the development of automotive semiconductors that comply with the ASIL B or higher functional safety ISO 26262 standard. The most preferred method for performing these quantitative assessments is the FMEDA analysis technique. FMEDA, along with the introduction of ISO 26262, is a quantitative safety analysis that has been used in the overall automotive industry for many years. However, the domestic semiconductor industry has little practical experience with FMEDA, perhaps because it is in the early process of introducing the functional safety ISO 26262. Moreover, since there are few FMEDA-related data suitable for the semiconductor level, it is difficult to understand and apply to semiconductor analysis. The aim of this paper is to gain a better understanding of the quantitative safety analysis at the semiconductor level by presenting a method of performing the FMEDA at the semiconductor level from a practical point of view. |
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